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    JIANG Hua, ZHOU Bai-yang, CHEN Hong-bin, DENG Guang-hua. THE CALIBRATION OF CAPACITANCE-DISPLACEMENT MICROMETER AND THE MEASUMENT OF THE MAGNETOSTRICTION COEFFICIENT OF THIN FILMS[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART A:PHYSICAL TESTING, 2006, 42(5): 235-238.
    Citation: JIANG Hua, ZHOU Bai-yang, CHEN Hong-bin, DENG Guang-hua. THE CALIBRATION OF CAPACITANCE-DISPLACEMENT MICROMETER AND THE MEASUMENT OF THE MAGNETOSTRICTION COEFFICIENT OF THIN FILMS[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART A:PHYSICAL TESTING, 2006, 42(5): 235-238.
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    THE CALIBRATION OF CAPACITANCE-DISPLACEMENT MICROMETER AND THE MEASUMENT OF THE MAGNETOSTRICTION COEFFICIENT OF THIN FILMS

      Abstract
    • By using a self-constructed equipment, the DWS type Capacitance-displacement micrometer was calibrated accurately and the error area of Cantilever displacement is lower than 5% in the large measuring range. The magnetostriction coefficient of a cantilever magnetostrictive thin film was measured through Capacitance-displacement method and the results were satisfied.
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