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    GENG Li-wei, ZHANG Xiao-yan, WANG Li, WANG Guang-de. SURFACE CHARACTERISTIC OF ITO GLASS POLISHED Al2O3 USING ATOMIC FORCE MICROSCOPY[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART A:PHYSICAL TESTING, 2007, 43(9): 433-436.
    Citation: GENG Li-wei, ZHANG Xiao-yan, WANG Li, WANG Guang-de. SURFACE CHARACTERISTIC OF ITO GLASS POLISHED Al2O3 USING ATOMIC FORCE MICROSCOPY[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART A:PHYSICAL TESTING, 2007, 43(9): 433-436.

    SURFACE CHARACTERISTIC OF ITO GLASS POLISHED Al2O3 USING ATOMIC FORCE MICROSCOPY

    • The surface characteristic of Indium-Ti-Oxide were observed using atomic force microscopy. The results indicated that there were differences between surface characteristic of ITO glass after polished by containing different granularity Al2O3 solutions,so did containing uniform granularity Al2O3 while different ultrasonic treatment. Performance changed with the different ITO glass surface characteristic. The maximum brightness was promoted from 12 350 cd/m2 to 25 880 cd/m2 after treatment,and the maximum efficiency could increase 50%. Optimization conditions of manufacture OLED were confirmed according the surface characteristic study using AFM.
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