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    WANG Jian-jun, SONG Wu-lin, GUO Lian-gui. THE ELECTRON BACK-SCATTER DIFFRACTION TECHNOLOGY AND ITS APPLICATION IN MATERIAL ANALYSIS[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART A:PHYSICAL TESTING, 2006, 42(6): 300-303.
    Citation: WANG Jian-jun, SONG Wu-lin, GUO Lian-gui. THE ELECTRON BACK-SCATTER DIFFRACTION TECHNOLOGY AND ITS APPLICATION IN MATERIAL ANALYSIS[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART A:PHYSICAL TESTING, 2006, 42(6): 300-303.

    THE ELECTRON BACK-SCATTER DIFFRACTION TECHNOLOGY AND ITS APPLICATION IN MATERIAL ANALYSIS

    • The basic principle and experimental analysis method of the Electron Back-Scatter Diffraction technology was introduced. Through EBSD analyzing systems mounted on Field Scanning Electronic Microscope, it can complete microstructure analysis of crystallographic structures and orientations of block sample, which can interconnect microstructure observation, micro-area chemical analysis and crystallography data analysis, and the EBSD technology become the most important analysis technology in Material Science Research.
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