Line Profile Analysis of Diffraction Line Broaden and Characterization of Microstructure

Lead to diffraction line broaden do not only have the crystallite and microcosmic stress but also have stacking faults/twins and dislocation. Round how separating many (two, three) fold broaden effects and how solving crystallite size, microstress, fault probability, dislocation density and dislocation distribution parameters, several methods of line profile analysis were developed. The advances and applications of line analysis techniques were introduced, and some works of authors in near ten years were introduced yet, from four parts including convolute relationships of line profiles and line broads, analysis techniques of crystallite-microstress two-fold effect, the least square method separating crystallite-microstress-fault and crystallite-fault-dislocation three-hold effects.