A NEW TECHNIQUE FOR X-RAY STRESS MEASUREMENT BASED ON USING IMAGE PLATE
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Graphical Abstract
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Abstract
A new technique for X-ray stress measurement has been introduced. The formula of calculating stress are inferred according to the theory of X-ray diffraction and the geometry of back-reflection for X-ray area detector,called an imaging plate (IP). According to the result of the example obtained by the present method,there are some advantages: rapid plane stress analysis and credible measured value.
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