LI Rong-zhu, YAO Su-juan. Maintenance and Fault Clearing of JEM-2100 TEM[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART A:PHYSICAL TESTING, 2012, 48(7): 454-456.
Citation:
LI Rong-zhu, YAO Su-juan. Maintenance and Fault Clearing of JEM-2100 TEM[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART A:PHYSICAL TESTING, 2012, 48(7): 454-456.
LI Rong-zhu, YAO Su-juan. Maintenance and Fault Clearing of JEM-2100 TEM[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART A:PHYSICAL TESTING, 2012, 48(7): 454-456.
Citation:
LI Rong-zhu, YAO Su-juan. Maintenance and Fault Clearing of JEM-2100 TEM[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART A:PHYSICAL TESTING, 2012, 48(7): 454-456.
JEM-2100 TEM is an ultrahigh resolution electron microscope that requires strict indoor environment.It′s important for users to periodically inspect and maintain the instrument,and also keep it clean and good running.Some fault cases of the instrument were presented including ways how to clear them.
DownLoad: