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    HE Tong, SUN Wei, JIN Yu, QI Yang, PEI Jian-fen. Structure Parameter of Bi Superconducting Thin Film Using X-Ray Reflectivity[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART A:PHYSICAL TESTING, 2009, 45(6): 345-347.
    Citation: HE Tong, SUN Wei, JIN Yu, QI Yang, PEI Jian-fen. Structure Parameter of Bi Superconducting Thin Film Using X-Ray Reflectivity[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART A:PHYSICAL TESTING, 2009, 45(6): 345-347.
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    Structure Parameter of Bi Superconducting Thin Film Using X-Ray Reflectivity

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      • Abstract
    • The method to measure the thickness and toughness of Bi superconducting thin film by X-ray reflectivity was studied. The principle of measurement and the setting steps of X-ray diffractometer were detailed introduced. This is a new method to study the properties of thin film.
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