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    WANG Bin, WANG Chun-liang, YANG Li, WANG Cheng-zhong. SIMPLE ESTIMATE ON UNCERTAINTY OF NANOINDENTATION TESTING METHOD[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART A:PHYSICAL TESTING, 2007, 43(6): 287-289.
    Citation: WANG Bin, WANG Chun-liang, YANG Li, WANG Cheng-zhong. SIMPLE ESTIMATE ON UNCERTAINTY OF NANOINDENTATION TESTING METHOD[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART A:PHYSICAL TESTING, 2007, 43(6): 287-289.

    SIMPLE ESTIMATE ON UNCERTAINTY OF NANOINDENTATION TESTING METHOD

    • It is difficulty to calculate subentry of uncertainty in nanoindentation because there are many factors. Compound estimate uncertainty of instrument hardness and young′s modulus on fused silicon were obtained.
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