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    CAO Yanfen, CAO Fangfang, KONG Qiangqiang, SONG Peng, XIN Ling, LI Haie. Application of scanning electron microscopy and X-ray energy spectrometer in quantitative analysis[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART A:PHYSICAL TESTING, 2024, 60(9): 15-18. DOI: 10.11973/lhjy-wl240130
    Citation: CAO Yanfen, CAO Fangfang, KONG Qiangqiang, SONG Peng, XIN Ling, LI Haie. Application of scanning electron microscopy and X-ray energy spectrometer in quantitative analysis[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART A:PHYSICAL TESTING, 2024, 60(9): 15-18. DOI: 10.11973/lhjy-wl240130

    Application of scanning electron microscopy and X-ray energy spectrometer in quantitative analysis

    • Scanning electron microscopy and X-ray energy spectrometer analysis were important methods for quantitative analysis of elements. The basic working principle of quantitative analysis of X-ray energy spectrometer was briefly described, and discussed the quantitative analysis methods of X-ray energy spectrometer, methods to improve the accuracy of quantitative analysis results, and common problems in quantitative analysis. It provided a certain reference for further improving the accuracy of quantitative analysis of energy spectrometer.
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