- 中国学术期刊(光盘版)全文收录期刊
- 中国学术期刊综合评价数据库来源期刊
- 中国期刊网、万方数据库入编期刊
- 中文科技期刊数据库(全文版)收录期刊
- 中国期刊全文数据库全文收录期刊
- 中国机械工程学会 理化检验分会 失效分析分会 会刊
| Citation: |
JIANG Rongrong, YAO Yirong, LI Ming, GUAN Jianmin, LU Huanming. Maintenance and upkeep of ion beam polisher[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART A:PHYSICAL TESTING, 2024, 60(11): 57-63. DOI: 10.11973/lhjy-wl230324
|
The ion beam polisher could quickly cut samples without stress-strain layers, foreign contaminants, and exposed the true internal structural information of the samples. The Leica EM TIC 3X three ion beam polisher was capable of processing three ion sources simultaneously, and had the advantages of large ion beam width, large area, non focused ion source energy dispersion, and minimal damage to the sample. The daily maintenance content of the instrument has been summarized, and several common problems and their solutions have been listed. The research results could provide reference for instrument users.
| [1] |
ERDMAN N ,CAMPBELL R ,ASAHINA S ．Precise SEM cross section polishing via argon beam milling[J]．Microscopy Today,2006, 14(3): 22-25.
|
| [2] |
LOUCKS R G ,REED R M ,RUPPEL S C ,et al ．Morphology,genesis,and distribution of nanometer-scale pores in siliceous mudstones of the Mississippian barnett shale[J]．Journal of Sedimentary Research,2009, 79(12): 848-861.
|
| [3] |
武磊,刘卫国,蔡长龙,等 ．ZnS离子束抛光过程中的粗糙度演变[J]．西安工业大学学报,2014, 34(12): 947-952.
|
| [4] |
马波,刘卫国,周顺,等 ．宽束径离子束抛光KDP晶体表面粗糙度特征研究[J]．西安工业大学学报,2020, 40(6): 589-597.
|
| [5] |
张革,崔云,赵娇玲,等 ．同时制备多个透射电镜截面试样的离子减薄方法[J]．理化检验(物理分册),2023, 59(10): 27-29.
|
| [6] |
王燕飞,黄宛真,郑遗凡,等 ．脆性材料截面透射电镜样品的制备[J]．理化检验(物理分册),2011, 47(4): 225-228.
|
| [7] |
JIANG R R ,LI M ,YAO Y R ,et al ．Application of BIB polishing technology in cross-section preparation of porous,layered and powder materials：a review[J]．Frontiers of Materials Science,2019, 13(2): 107-125.
|
Supported by: Beijing Renhe Information Technology Co., Ltd. 
DownLoad: