Scanning electron microscope analysis method for corn starch

Regulus 8230 high resolution scanning electron microscope was used to observe the microstructure of corn starch with poor conductivity. The effects of sample dispersion method, gold spraying treatment and different voltage modes on the image quality of scanning electron microscope of corn starch were compared and analyzed. The results showed that the ultrasonic dispersion method could obtain more uniform particle distribution, which was conducive to the observation of the microstructure of corn starch. The charge effect was decreased and the image quality was improved when the corn starch after gold spraying was observed by scanning electron microscope at low magnification. When the corn starch after gold spraying was observed by scanning electron microscope at high magnification, cracks appeared on the particle surface, so gold spraying was not recommended. For non-gold sprayed corn starch, electron beam deceleration mode should be used for observation, which could significantly improve the image quality of scanning electron microscope analysis.