X-ray diffraction measurement of orientation deviation angle of super-large Gaussian grain in oriented silicon steel

LIN Zibo; LIU Jianhui; WU Zhongwang; LI Yiming; JIN Zili

doi:10.11973/lhjy-wl202202009

PHYSICAL TESTING AND CHEMICAL ANALYSIS PART A:PHYSICAL TESTING > 2022 > 58(2): 36-39. > DOI: 10.11973/lhjy-wl202202009

LIN Zibo, LIU Jianhui, WU Zhongwang, LI Yiming, JIN Zili. X-ray diffraction measurement of orientation deviation angle of super-large Gaussian grain in oriented silicon steel[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART A:PHYSICAL TESTING, 2022, 58(2): 36-39. DOI: 10.11973/lhjy-wl202202009

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X-ray diffraction measurement of orientation deviation angle of super-large Gaussian grain in oriented silicon steel

1. Key Laboratory of Advanced Metals and Materials of Inner Mongolia, School of Materials and Metallurgy, Inner Mongolia University of Science and Technology, Baotou 014010, China;
2. Baotou Sande Battery Material Co., Ltd., Baotou 014010, China

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Received Date: March 13, 2021

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Abstract

This paper introduces a X-ray diffraction measurement method of Gaussian grain orientation deviation angle for ultra-large grain oriented silicon steel, and puts forward a method of combining the test method with the detector scanning. The results show that this method can obtain accurate actual diffraction angle and orientation deviation angle at the same time. The sample preparation method is simple, the requirements for equipment are low, and the measurement results are accurate.
- oriented silicon steel,
- Gaussian grain orientation,
- deviation angle,
- X-ray diffraction

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X-ray diffraction measurement of orientation deviation angle of super-large Gaussian grain in oriented silicon steel

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