X-ray diffraction measurement of orientation deviation angle of super-large Gaussian grain in oriented silicon steel

This paper introduces a X-ray diffraction measurement method of Gaussian grain orientation deviation angle for ultra-large grain oriented silicon steel, and puts forward a method of combining the test method with the detector scanning. The results show that this method can obtain accurate actual diffraction angle and orientation deviation angle at the same time. The sample preparation method is simple, the requirements for equipment are low, and the measurement results are accurate.