Citation: | WANG Rong. Failure Analysis on Mechanical Equipments (Continued) Lecture 6 X-ray Diffraction Analysis Technique[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART A:PHYSICAL TESTING, 2017, 53(8): 562-572,598. DOI: 10.11973/lhjy-wl201708007 |
[1] |
鄢国强.材料质量检测与分析技术[M].北京:中国计量出版社,2005.
|
[2] |
王荣.机械装备的失效分析(续前)第3讲断口分析技术(上)[J].理化检验-物理分册,2016,52(10):698-704.
|
[3] |
马礼敦.X射线粉末衍射的发展与应用——纪念X射线粉末衍射发现一百年(续前)[J].理化检验-物理分册,2016,52(9):630-632.
|
[4] |
杨于兴,漆睿.X射线衍射分析[M].上海:上海交通大学出版社,1994.
|
[5] |
王荣.机械装备的失效分析(续前)第5讲定量分析技术[J].理化检验-物理分册,2017,53(6):413-421.
|
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