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    GUO Hai-xia, WANG Ming-jian, WANG Shi-ning. Method for Preparing Metallographic Samples with Thin and Dark Surface Layer[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART A:PHYSICAL TESTING, 2017, 53(4): 253-254. DOI: 10.11973/lhjy-wl201704006
    Citation: GUO Hai-xia, WANG Ming-jian, WANG Shi-ning. Method for Preparing Metallographic Samples with Thin and Dark Surface Layer[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART A:PHYSICAL TESTING, 2017, 53(4): 253-254. DOI: 10.11973/lhjy-wl201704006

    Method for Preparing Metallographic Samples with Thin and Dark Surface Layer

    • For the situation that the metallographic samples with thin and dark surface layer were difficult to be prepared by the conventional method, two kinds of metallographic sample preparation methods for the protection of such surface layer were introduced. One of the methods was to make the surface layers of the two identical samples closely contact to each other, and the other method was to make the surface layer tightly attach with a thin copper sheet. The preparation effect of these two methods was compared with that of the conventional method. The results show that both of these two methods could effectively protect the surface layer of metallographic samples, and make observing or measuring the surface layer easier.
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