高级检索

    X射线衍射在材料结构表征中的应用

    Application of X-ray Diffraction in Characterization of Material Structure

    • 摘要: 扼要介绍了单晶、多晶、表面及薄膜衍射等各种技术在三个层次 (多晶聚集态结构、分子与晶体结构和晶体内微结构) 的材料结构表征中的应用。还从衍射仪种类、主要组成部件和重要附件三个方面介绍了X射线衍射试验装置。

       

      Abstract: The structural characterization of polycrystalline materials,molecule and crystal structure,micro-structure in crystal by X-ray single crystal diffraction,polycrystalline diffraction,surface and film diffraction and other techniques were reviewed. The main assemblies of diffractometers,the types of diffractometer and some important attachments were introduced yet.

       

    /

    返回文章
    返回