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    用光谱分析进行低硅钒钛生铁的质量控制研究

    THE QUALITY CONTROL RESEARCH FOR THE LOW Si-V-Ti PIG IRON BY SPECTRUM ANALYSIS

    • 摘要: 通过使用X射线衍射仪(XRD)及扫描电子显微镜(SEM)对光谱分析用的控制样品进行相分析和显微分析,同时对光谱控制样品的取样、组织和结构等方面也进行了研究,以保证光谱分析量值传递的规范、严谨,确保光谱分析的准确性。

       

      Abstract: The X-ray diffraction is used to analyze the phase of the pig iron and the scan electronic microscope is also used to examine the microstructure of the cast iron. To guarantee the accuracy of the spectrum analysis results,the sampling,microstructure and atomic transmission of the spectrum analysis value correctly are studied.

       

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