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    J75不锈钢淬火应力的X射线衍射分析

    Stress Analysis of J75 Stainless Steel Aftrer Quenching by X-ray Diffraction

    • 摘要: 利用铬靶X射线在侧倾结合固定ψ法基础上对J75不锈钢的(311)面进行了淬火应力测量,得到了不同淬火温度下J75合金试样中心点的残余应力值和近表面微应变效应。结果表明:试样表面残余压应力值在-400~-650 MPa,最大值出现在淬火温度为700℃左右;淬火使衍射峰半高宽由1.25°增加至1.4°以上,显著增加了J75合金的位错等缺陷。受淬火瞬时热应力分布影响,越靠近试样表面衍射峰的宽化越严重。

       

      Abstract: Based on the side tilt and fix ψ method,the (311) plane of quenched J75 stainless steel was measured by X-ray diffraction. The residual stress and micro-strain effects of J75 stainless steel surface center in different quenching temperatures were determined. The measurement results showed that the compressed residual stress in the sample surface was between -400 MPa and -650 MPa,the maximal value appeared when quenching temperature was about 700℃. The quenching also causeed the increase of FWHM of diffraction peaks from 1.25°to above 1.4°,so a lot of dislocations and other defect developed and according to the instantaneous heat stress distribution,the nearer the surface was,the larger the diffraction line broadening was.

       

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