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    扫描电子显微镜用X射线能谱仪在定量分析中的应用

    Application of scanning electron microscopy and X-ray energy spectrometer in quantitative analysis

    • 摘要: 扫描电子显微镜用X射线能谱仪分析是元素定量分析的重要手段。对X射线能谱仪定量分析的基本工作原理进行简述,并对X射线能谱仪的定量分析方式、提高定量分析结果准确性的方法,以及定量分析中常见的问题进行了探讨,为进一步提高能谱仪定量分析的准确性提供了一定的参考。

       

      Abstract: Scanning electron microscopy and X-ray energy spectrometer analysis were important methods for quantitative analysis of elements. The basic working principle of quantitative analysis of X-ray energy spectrometer was briefly described, and discussed the quantitative analysis methods of X-ray energy spectrometer, methods to improve the accuracy of quantitative analysis results, and common problems in quantitative analysis. It provided a certain reference for further improving the accuracy of quantitative analysis of energy spectrometer.

       

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