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    透射电镜在晶界角度测量上的应用

    Application of Transmission Electron Microscopy in Grain Boundary Angle Measurement

    • 摘要: 对透射电镜菊池线进行了研究计算,开发了菊池线的潜在应用,建立了利用透射电镜菊池线进行小角度晶界测量的新方法。结果表明,利用不同晶粒的菊池中心可以有效地计算不同晶粒之间的角度,并且角度值在不同菊池线条件下表现出的偏差极小(相对偏差仅有2.88%),具有较好的一致性。

       

      Abstract: Based on the study and calculation of Kikuchi line of transmission electron microscopy, The potential application of Kikuchi line was developed, and a new method of small angle grain boundary measurement using Kikuchi line of transmission electron microscopy was established. The results show that the angle between different grains could be calculated effectively by using the Kikuchi center of different grains. In addition, the deviation of the angle value was very small (the relative deviation was only 2.88%) under different conditions of Kikuchi line, which had good consistency.

       

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