Abstract: Several kinds of photovoltaic raw and auxiliary materials were tested and analyzed by scanning electron microscope, such as coating glass, silicon wafers, welding strips and back sheets. The application of scanning electron microscope in different fields were introduced respectively, including structure observation, measurement of layers of coating glass, analysis on surface morphology and space measurement of silicon wafers, micro analysis on the welding strip surface, type distinguish and thickness measurement of back sheets. The results could provide reference for the research and test of photovoltaic raw and auxiliary materials, such as performance research of coating glass, process optimization analysis of solar cells, performance evaluation of welding strips, inspection and identification of backsheets.